512 GB max capacity SD/microSD memory cards for AI-driven Video…

512 GB max capacity SD/microSD memory cards for AI-driven Video applications

05/04/2024

The S650Si (TLC) and S750Pi (pSLC) Series SD and microSD memory cards built with 176-layer 3D NAND technology and low-density parity check (LDPC) controller.

With expanded capacity offerings up to 512 GB and 5-year extended supply longevity support, the new memory cards are targeted for growing segments spurred by 5G, artificial intelligence (AI), and edge technologies, such as AI-enabled surveillance, smart homes, mobile monitoring, automotive recorders, remote healthcare, and security surveillance systems requiring heavy write and re-write usage.

Main Features

	SDHC / SDXC	SDXC	microSDHC / microSDXC	microSDXC
Product Line	Premium	Superior	Premium	Superior
Product Line	S750Pi / S750Pc	S650Si / S650Sc	S750Pi / S750Pc	S650Si / S650Sc
Interface	UHS-I	UHS-I	UHS-I	UHS-I
Flash Type	3D TLC (pSLC mode)	3D TLC	3D TLC (pSLC mode)	3D TLC
Form Factor	SD Card		microSD Card
Operating Temperature	-40°C to 85°C / -25°C to 85°C	-40°C to 85°C / -25°C to 85°C	-40°C to 85°C / -25°C to 85°C	-40°C to 85°C / -25°C to 85°C
Power Loss Protection Options	Firmware Based	Firmware Based	Firmware Based	Firmware Based
Capacity	16GB to 128GB	64GB to 512GB	16GB to 128GB	64GB to 512GB
Performance
Sequential Read (MB/s) up to	95	95	95	95
Sequential Write (MB/s) up to	80	80	80	80
Endurance and Reliability
Endurance (TBW)1 up to	12,670	2,000	12,670	2,000
Reliability MTBF @ 25°C	>3,000,000 hours	>2,000,000 hours	>3,000,000 hours	>2,000,000 hours
Reliability Number of Insertions	20,000 (SDA spec minimum 10,000)	20,000 (SDA spec minimum 10,000)	20,000 (SDA spec minimum 10,000)	20,000 (SDA spec minimum 10,000)
Others
Dimensions	32.0 x 24.0 x 2.1	32.0 x 24.0 x 2.1	15.0 x 11.0 x 1.0	15.0 x 11.0 x 1.0
Certifications	CE, FCC, UKCA, RoHS	CE, FCC, UKCA, RoHS	CE, FCC, UKCA, RoHS	CE, FCC, UKCA, RoHS
Warranty	5 years	2 years	5 years	2 years
1 Under highest Sequential write value. May vary by density, configuration and applications.