SiC Benefits:
Next Generation SiC Schottky Barrier Diodes
- Improved system efficiency, lower forward voltage, and higher switching frequency vs. silicon diodes
- Exhibits essentially zero forward and reverse recovery losses vs. silicon diodes which have higher losses over temperature
- Extreme robustness with no change in parameters even after 1,000 back-to-back surge hits
- High unclamped inductive switching (UIS) capability
- High repetitive UIS (R-UIS) capability with no degradation after more than 10 K hits at rated current
- AEC-Q101 qualification for added reliability and ruggedness
Next Generation SiC MOSFETs
- Higher SiC power density and switching frequency vs. silicon enables smaller magnetics, transformers, and cooling elements for compact form factor (lowers system cost)
- Low RDS(on) across temperature (175 degrees Celsius) leads to lower switching losses operating temperature range
- High UIS capability
- High R-UIS capability with no lifetime gate oxide degradation even after 100 K cycles
- Longest short circuit withstand rating to protect circuit design
- AEC-Q101 qualification for added reliability and ruggedness
SiC Power Modules Including SP6LI
- Design expertise
- High power density
- Low profile packages including low inductance SP6LI
- Extended temperature capabilities
- Pin locating flexibility
- Mix of silicon/silicon carbide diode and MOSFET die