Electronic Component Solutions

Next Generation Phase Noise Analyzer

New 53100A Phase Noise Analyzer for measuring precision atomic clocks, quartz and other high-performance oscillators up to 200 MHz. The intuitive PC-based interface makes it easy to acquire frequency stability measurements including Allan Deviation (ADEV), phase noise, AM noise, jitter measurements and more. The small size, rapid acquisition time and backwards compatibility with the legacy 5120a series of phase noise analyzers make the 53100A easy to integrate into existing test infrastructure or for it to serve as the workhorse for high-performance metrology applications.

Key Features:

  • Allan deviation (ADEV) typically less than 5E-14 at t=1s
  • Modified Allan deviation (MDEV), Hadamard deviation (HDEV), and time deviation (TDEV)
  • RMS-integrated time jitter, residual FM, and SSB carrier/noise ratio
  • Phase noise and AM noise at offsets from 0.001 Hz to 1 MHz and levels below typically below -175 dBc/Hz (10 MHz floor)
  • Independent input and reference frequencies from 1 to 200 MHz
  • No phase-locking or measurement calibration required
  • Single or dual reference oscillator inputs allow cross-correlation measurements
  • TSC 51XXA command and data stream emulation reduces the burden of re-writing existing test scripts
  • Intuitive Graphical User Interface for easy set-up and monitoring

53100A Datasheet

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